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Circuit design
Results: 1446

#	Item
461	Functional Testing Functional Testing Objectives: This section explains: Add to Reading List Source URL: www.soft-test.com Language: English - Date: 2013-05-02 03:39:00 Electromagnetism Electronic design automation Electronic test equipment Electronic design Flip-flop Comparator Logic level In-circuit functional tester Automatic test pattern generation Electronic engineering Electronics Digital electronics
462	Constraint Satisfaction Modules A Methodology for Analog Circuit Design Piotr Mitros [removed] Massachusetts Institute of Technology Add to Reading List Source URL: mitros.org Language: English - Date: 2008-05-17 03:27:14 Artificial intelligence Lagrange multiplier Constraint programming Constraint satisfaction Constraint logic programming
463	Table of Contents Introduction to DFT . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-1 Objectives: . . . . . . . . . . . . . . . . . . . . . . . . Add to Reading List Source URL: www.soft-test.com Language: English - Date: 2013-02-18 04:29:00 Electronics manufacturing Automatic test pattern generation Boundary scan Joint Test Action Group Scan chain Fault coverage In-circuit test Logic simulation Stuck-at fault Electronic engineering Electronics Electronic design automation
464	Constraint Satisfaction Modules A Methodology for Analog Circuit Design Piotr Mitros [removed] Massachusetts Institute of Technology Add to Reading List Source URL: mitros.org Language: English - Date: 2008-05-17 03:41:17 Point on plane closest to origin Constraint programming Constraint satisfaction Constraint logic programming
465	The PCB Library Expert Solution PCB Libraries, Inc. Updated[removed] What’s YOUR Problem? Add to Reading List Source URL: www.pcblibraries.com Language: English - Date: 2015-03-12 12:20:27 Electronics Printed circuit board PCB Wave soldering Surface-mount technology TARGET 3001! CR-5000 Electronic engineering Electronics manufacturing Electronic design automation
466	LAWS OF TRINIDAD AND TOBAGO MINISTRY OF LEGAL AFFAIRS www.legalaffairs.gov.tt LAYOUT-DESIGNS (TOPOGRAPHIES) Add to Reading List Source URL: ipo.gov.tt Language: English - Date: 2013-06-26 16:05:01 Integrated circuit Law Technology Creativity Semiconductor Chip Protection Act Integrated Circuit Topography Act Intellectual property law Integrated circuits Integrated circuit layout design protection
467	[removed]David Jeffrey Ljung Madison - Resume David Jeffrey Ljung Madison Programming, Algorithm Design/Development, VLSI / CPU Verification Add to Reading List Source URL: davesource.com Language: English - Date: 2014-10-17 23:07:38 Hardware description languages Hardware verification languages Formal methods Logic in computer science Verilog Application-specific integrated circuit Post-silicon validation Formal verification Random test generator Electronic engineering Electronic design automation Digital electronics
468	Quantum Fault Tolerance Peter Shor M.I.T. Cambridge, MA 1 Add to Reading List Source URL: cba.mit.edu Language: English - Date: 2011-12-13 18:50:25 Physics Quantum error correction Quantum computer Quantum circuit No-cloning theorem Toric code Quantum gate Anyon Fault-tolerant design Quantum information science Theoretical computer science Quantum mechanics
469	Constraint Satisfaction Modules: A Methodology for Analog Circuit Design by Piotr Mitros B.S., Mathematics (2004) Add to Reading List Source URL: mitros.org Language: English - Date: 2007-09-04 19:04:05 Ethics Philosophy of science Electrical engineering Gerald Jay Sussman Computer engineering Computer Digital electronics Passivity Electromagnetism Electronics Engineering
470	Table of Contents Introduction to DFT . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-1 Objectives: . . . . . . . . . . . . . . . . . . . . . . . . Add to Reading List Source URL: www.soft-test.com Language: English - Date: 2013-01-28 01:04:00 Electronics manufacturing Automatic test pattern generation Boundary scan Joint Test Action Group Scan chain Fault coverage In-circuit test Logic simulation Stuck-at fault Electronic engineering Electronics Electronic design automation

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